Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
Code Kennzahl
E360
 
Type of Organization Organisationstyp
Institute
Parent OrgUnit Übergeordnete Organisation
 
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PreviewAuthor(s)TitleTypeIssue Date
1Jorstad-2024-PHYSICA B-CONDENSED MATTER-vor.pdf.jpgJorstad, Nils Petter ; Fiorentini, Simone ; Ender, Johannes ; Wolfgang Goes ; Selberherr, Siegfried ; Sverdlov, Viktor Micromagnetic modeling of SOT-MRAM dynamicsArticle Artikel 1-Mar-2024
2Hamidi, Hoda ; Shojaei, F. ; Pourfath, Mahdi ; Vaez zadeh, Mehdi Adsorption behavior of some green corrosion inhibitors on Fe (110) surface: The critical role of d-π interactions in binding strengthArticle Artikel 17-Jan-2024
3Hadamek, Tomas ; Jorstad, Nils Petter ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Numerical study of two-terminal SOT-MRAMArticle Artikel 15-Jan-2024
4Reiter-2023-Solid-State Electronics-vor.pdf.jpgReiter, Tobias ; Aguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Weinbub, Josef ; Hössinger, Andreas ; Filipovic, Lado Modeling the Impact of Incomplete Conformality During Atomic Layer ProcessingArticle Artikel Jan-2024
5Shayanfar, Reza ; Alidoosti, Mohammad ; Nasr Esfahani, Davoud ; Pourfath, Mahdi The carrier mobility and superconducting properties of monolayer oxygen-terminated functionalized MXene Ti₂CO₂Article Artikel 14-Dec-2023
6Bendra, Mario ; Jorstad, Nils Petter ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor Unified Modeling of Ultra-Scaled STT-MRAM Cells: Harnessing Parasitic Effects for Enhanced Data Storage DynamicsInproceedings Konferenzbeitrag 9-Dec-2023
7Lashani Zand-2023-ACS Omega-vor.pdf.jpgLashani Zand, Ali ; Niksirat, Amin ; Sanaee, Zeinab ; Pourfath, Mahdi Comprehensive study of lithium diffusion in Si/C-layer and Si/C₃N₄ composites in a faceted crystalline silicon anode for fast-charging lithium-ion batteriesArticle Artikel 28-Nov-2023
8Filipovic, Lado ; Bobinac, Josip ; Piso, Julius ; Reiter, Tobias Physics-Informed Compact Model for SF6/O2 Plasma EtchingInproceedings Konferenzbeitrag20-Nov-2023
9Leroch, Sabine ; Stella, Robert ; Hössinger, Andreas ; Filipovic, Lado Molecular Dynamics Study of Al Implantation in 4H-SiCInproceedings Konferenzbeitrag20-Nov-2023
10Reiter, Tobias ; Toifl, Alexander ; Hössinger, Andreas ; Filipovic, Lado Modeling Oxide Regrowth During Selective Etching in Vertical 3D NAND StructuresInproceedings Konferenzbeitrag20-Nov-2023
11Wilhelmer, Christoph ; Waldhör, Dominic ; Milardovich, Diego ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Electron Trapping in Amorphous Silicon Nitride (a-Si3N4:H)Inproceedings Konferenzbeitrag20-Nov-2023
12Hadamek, Tomas ; Jorstad, Nils Petter ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Study of Self-Heating and its Effects in SOT-STT-MRAMInproceedings Konferenzbeitrag20-Nov-2023
13Ferry, David K. ; Oriols, Xavier ; Weinbub, Josef Quantum Transport in Semiconductor Devices: Simulation Using ParticlesBook BuchNov-2023
14Jorstad, Nils Petter ; Hadamek, Tomas ; Bendra, Mario ; Ender, Johannes ; Pruckner, Bernhard ; Goes, Wolfgang ; Sverdlov, Viktor Numerical Simulations of Spintronic Magnetoresistive MemoriesInproceedings Konferenzbeitrag26-Oct-2023
15Sverdlov, Viktor ; Selberherr, Siegfried Charge and Spin Transport in Semiconductor DevicesInproceedings Konferenzbeitrag 24-Oct-2023
16Gull-2023-Solid-State Electronics-vor.pdf.jpgGull, Josef ; Kosina, Hans Monte Carlo study of electron–electron scattering effects in FET channelsArticle Artikel Oct-2023
17Bendra-2023-Solid-State Electronics-vor.pdf.jpgBendra, Mario ; Fiorentini, Simone ; Selberherr, Siegfried ; Gös, Wolfgang ; Sverdlov, Viktor A multi-level cell for ultra-scaled STT-MRAM realized by back-hoppingArticle Artikel Oct-2023
18Sverdlov, Viktor ; Bendra, Mario ; Pruckner, Bernhard ; Jorstad, Nils Petter ; Hadamek, Tomas ; Ender, Johannes ; Lacerda de Orio, Roberto ; Gös, Wolfgang Spin and Charge Transport in Ultra-Scaled MRAM CellsInproceedings Konferenzbeitrag Oct-2023
19Souza Berti Rodrigues-2023-Journal of Computational Electronics-vor.pdf.jpgSouza Berti Rodrigues, Francio ; Aguinsky, Luiz Felipe ; Lenz, Christoph ; Hössinger, Andreas ; Weinbub, Josef 3D modeling of feature-scale fluorocarbon plasma etching in silicaArticle Artikel Oct-2023
20Reiter, Tobias ; Filipovic, Lado Fast 3D Flux Calculation using Monte Carlo Ray Tracing on GPUsInproceedings Konferenzbeitrag 20-Sep-2023