Forschungsbereich Mikroelektronik

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Organization Name (de) Name der Organisation (de)
E360-01 - Forschungsbereich Mikroelektronik
 
Code Kennzahl
E360-01
 
Type of Organization Organisationstyp
Research Division
 
Parent OrgUnit Übergeordnete Organisation
Active Aktiv
 

OrgUnit's Publications


Results 1-20 of 73 (Search time: 0.001 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Leroch, S. ; Eder, Stefan ; Varga, M. ; Rodríguez Ripoll, M. Material point simulations as a basis for determining Johnson–Cook hardening parameters via instrumented scratch testsArticle Artikel 1-Apr-2023
2Bobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
3Bobinac-2023-Micromachines-vor.pdf.jpgBobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
4Weinbub, Josef ; Ballicchia, Mauro ; Etl, Clemens ; Nedjalkov, Mihail Wigner Signed Particles for Electron Quantum OpticsPresentation Vortrag6-Mar-2023
5Aguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado ; Hössinger, Andreas ; Weinbub, Josef Modeling Incomplete Conformality During Atomic Layer Deposition in High Aspect Ratio StructuresArticle Artikel 1-Mar-2023
6Lenz-2023-Journal of Scientific Computing-vor.pdf.jpgLenz, Christoph ; Aguinsky, Luiz Felipe ; Hössinger, Andreas ; Weinbub, Josef A Complementary Topographic Feature Detection Algorithm Based on Surface Curvature for Three-Dimensional Level-Set FunctionsArticle Artikel Mar-2023
7Bendra-2023-Solid-State Electronics-vor.pdf.jpgBendra, Mario ; Fiorentini, Simone ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor The Influence of Interface Effects on the Switching Behavior in Ultra-Scaled MRAM CellsArticle Artikel Mar-2023
8Aguinsky-2023-Solid-State Electronics-vor.pdf.jpgAguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado ; Hössinger, Andreas ; Weinbub, Josef Modeling Incomplete Conformality During Atomic Layer Deposition in High Aspect Ratio StructuresArticle Artikel Mar-2023
9Sverdlov, Viktor ; El-Sayed, Al-Moatasem Bellah ; Seiler, Heribert ; Kosina, Hans Edge States Dispersion in Narrow Nanoribbons of 2D Transition Metal Dichalcogenides in the 1T′ Topological PhaseInproceedings Konferenzbeitrag12-Feb-2023
10Lenz, Christoph ; Aguinsky, Luiz Felipe ; Hössinger, Andreas ; Weinbub, Josef A Complementary Topographic Feature Detection Algorithm Based on Surface Curvature for Three-Dimensional Level-Set FunctionsArticle Artikel 8-Feb-2023
11Leroch-2023-Frontiers in Manufacturing Technology-vor.pdf.jpgLeroch, S. ; Grützmacher, Philipp ; Heckes, H. ; Eder, Stefan Towards a multi-abrasive grinding model for the material point methodArticle Artikel 3-Feb-2023
12Filipovic, Lado ; Baumgartner, Oskar ; Klemenschits, Xaver ; Piso, Julius ; Bobinac, Josip ; Reiter, Tobias ; Strof, Georg ; Rzepa, Gerhard ; Stanojevic, Zlatan ; Karner, Markus DTCO flow for air spacer generation and its impact on power and performance at N7Article Artikel Jan-2023
13Fiorentini, Simone ; Ender, Johannes ; Selberherr, Siegfried ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Sverdlov, Viktor Comprehensive evaluation of torques in ultra-scaled MRAM devicesArticle Artikel Jan-2023
14Cervenka, Johann ; Kosik, Robert ; Vasicek, Martin-Thomas ; Gritsch, Markus ; Selberherr, Siegfried ; Grasser, Tibor ; Rudan, Massimo ; Brunetti, Rossella ; Reggiani, Susanna Macroscopic Transport Models for Classical Device SimulationBook Contribution Buchbeitrag2023
15Bendra, Mario ; Loch, Wilton Jaciel ; Jorstad, Nils Petter ; Fiorentini, Simone ; Selberherr, Siegfried ; Gös, Wolfgang ; Sverdlov, Viktor Modeling Ultra-Scaled Multi-Layer STT-MRAM Cells: A Unified Spin and Charge Drift-Diffusion ApproachInproceedings Konferenzbeitrag 7-Dec-2022
16Fiorentini, Simone ; Bendra, Mario ; Ender, Johannes ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Spin and charge drift-diffusion in ultra-scaled MRAM cellsArticle Artikel 5-Dec-2022
17Fiorentini-2022-Scientific Reports-vor.pdf.jpgFiorentini, Simone ; Bendra, Mario ; Ender, Johannes ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Spin and charge drift-diffusion in ultra-scaled MRAM cellsArticle Artikel 5-Dec-2022
18Ceric, Hajdin ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Statistical Study of Electromigration in Gold InterconnectsInproceedings Konferenzbeitrag 31-Oct-2022
19Kosina, Hans Numerische Modellierung der Beweglichkeit in verspanntem SiliziumPresentation Vortrag13-Oct-2022
20Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado Modeling Plasma-Induced Damage During the Dry Etching of SiliconInproceedings Konferenzbeitrag9-Oct-2022