Forschungsbereich Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360-01 - Forschungsbereich Mikroelektronik
 
Code Kennzahl
E360-01
 
Type of Organization Organisationstyp
Research Division
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 


Results 21-40 of 131 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
21Ceric, Hajdin ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Statistical Study of Electromigration in Gold InterconnectsArticle Artikel Aug-2023
22Hadamek-2023-Micromachines-vor.pdf.jpgHadamek, Tomas ; Jorstad, Nils Petter ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor A Comprehensive Study of Temperature and Its Effects in SOT-MRAM DevicesArticle Artikel Aug-2023
23Selberherr, Siegfried ; Sverdlov, Viktor Technology Computer-Aided Design: A Key Component of Microelectronics' DevelopmentBook Contribution Buchbeitrag 3-Jul-2023
24Akhound, M.A. ; Soleimani, M. ; Pourfath, M. Controllable Gas Adsorption via Inter-Coupled Ferroelectricity in In₂Se₃ MonolayerArticle Artikel 3-Jul-2023
25Zarate-Galvez-2023-ECS Journal of Solid State Science and Technology-vor.PDF.jpgZarate-Galvez, Sarai ; Garcia-Barrientos, Abel ; Lastras-Martinez, Luis Felipe ; Cardenas-Juarez, Marco ; Macias-Velasquez, Sharon ; Filipovic, Lado ; Arce-Casas, Armando Optimization of Doping Concentration to Obtain High Internal Quantum Efficiency and Wavelength Stability in An InGaN/GaN Blue Light-Emitting DiodeArticle Artikel Jul-2023
26Olivares, Stefano ; Weinbub, Josef IWW International Wigner Workshop 2023: Book of AbstractsProceedings Tagungsband 27-Jun-2023
27Ballicchia, Mauro ; Nedjalkov, Mihail ; Weinbub, Josef Coherent Wigner Dynamics of a Superposition State in a Tunable Barrier Quantum DotInproceedings Konferenzbeitrag12-Jun-2023
28Wilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab initio investigations of electron and hole trapping processes of H induced defects in amorphous SiO₂Inproceedings Konferenzbeitrag12-Jun-2023
29Ballicchia, Mauro ; Nedjalkov, Mihail ; Weinbub, Josef Gauge-Invariant Wigner Particle Model for Linear Electromagnetic FieldsInproceedings Konferenzbeitrag 11-Jun-2023
30Ender, Johannes ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Sverdlov, Viktor Towards Efficient SOT-assisted STT-MRAM Cell Switching using Reinforcement LearningInproceedings Konferenzbeitrag 5-Jun-2023
31Jorstad, Nils Petter ; Fiorentini, Simone ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Micromagnetic Modeling of SOT-MRAM DynamicsInproceedings Konferenzbeitrag 4-Jun-2023
32Pruckner, Bernhard ; Fiorentini, Simone ; Goes, Wolfgang ; Sverdlov, Viktor Impact of Spin-Flip Length in dsMTJ Spacer Layers on Switching PerformanceInproceedings Konferenzbeitrag 4-Jun-2023
33Bendra, Mario ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor Simulation of Spin-Torque and Magnetization Dynamics in STT-MRAM Multi-Level CellsInproceedings Konferenzbeitrag 4-Jun-2023
34Pruckner, Bernhard ; Fiorentini, Simone ; Jorstad, Nils Petter ; Hadamek, Tomas ; Selberherr, Siegfried ; Gös, Wolfgang ; Sverdlov, Viktor Switching Performance of Mo-based pMTJ and dsMTJ StructuresInproceedings KonferenzbeitragJun-2023
35Medina-Bailon-2023-Nano Express-vor.pdf.jpgMedina-Bailon, Cristina ; Nedialkov, Mihail Hristov ; Georgiev, Vihar ; Selberherr, Siegfried ; Asenov, Asen Comprehensive mobility study of silicon nanowire transistors using multi-subband modelsArticle Artikel Jun-2023
36Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Charge Trapping Sites in Amorphous Si₃N₄Presentation Vortrag30-May-2023
37HosseinpourRokni, Mohsen ; Naderi, Reza ; Soleimani, Maryam ; Kowsari, Elaheh ; Pourfath, Mahdi Indirect interactions between the ionic liquid and Cu surface in 0.5 M HCl: a novel mechanism explaining cathodic corrosion inhibitionArticle Artikel 15-May-2023
38Bendra, Mario ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor A Multi-Level Cell for Ultra-Scaled STT-MRAM Realized by Back-HoppingInproceedings Konferenzbeitrag 10-May-2023
39Gull, Josef ; Kosina, Hans Monte-Carlo Investigation of Energy Distributions in FET ChannelsInproceedings Konferenzbeitrag 10-May-2023
40Leroch, S. ; Eder, Stefan ; Varga, M. ; Rodríguez Ripoll, M. Material point simulations as a basis for determining Johnson–Cook hardening parameters via instrumented scratch testsArticle Artikel 1-Apr-2023