Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA2009)
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Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA2009)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Orio, Roberto ; Ceric, Hajdin ; Cervenka, Johann ; Selberherr, Siegfried | The Effect of Microstructure on the Electromigration Lifetime Distribution | Konferenzbeitrag Inproceedings | 2009 |