Proceedings of the Stress-Induced Phenomena in Metallization: 10#^{th} International Workshop
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Proceedings of the Stress-Induced Phenomena in Metallization: 10#^{th} International Workshop
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, Hajdin ; Orio, Roberto ; Cervenka, Johann ; Selberherr, Siegfried | Stress-Induced Anisotropy of Electromigration in Copper Interconnects | Konferenzbeitrag Inproceedings | 2008 |