18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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		Preview	Author(s)	Title	Type	Issue Date
	1		Ceric, H. ; de Orio, R. L. ; Selberherr, S.	Integration of atomistic and continuum-level electromigration models	Konferenzbeitrag Inproceedings	2011