18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Book title Buchtitel
18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, H. ; de Orio, R. L. ; Selberherr, S. | Integration of atomistic and continuum-level electromigration models | Konferenzbeitrag Inproceedings | 2011 |