18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Ceric, H. ; de Orio, R. L. ; Selberherr, S. | Integration of atomistic and continuum-level electromigration models | Konferenzbeitrag Inproceedings | 2011 |