Abstracts of 12th International Workshop on Stress-Induced Phenomena in Microelectronics
Book title Buchtitel
Abstracts of 12th International Workshop on Stress-Induced Phenomena in Microelectronics
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, Hajdin ; Orio, Roberto ; Zisser, Wolfhard ; Schnitzer, V. ; Selberherr, Siegfried | Modeling of Microstructural Effects on Electromigration Failure | Konferenzbeitrag Inproceedings | 2012 |