Proceedings of the IEEE International Reliability Physics Symposium
Book title Buchtitel
Proceedings of the IEEE International Reliability Physics Symposium
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Huang, R ; Robl, W. ; Detzel, T. ; Ceric, Hajdin | Modeling of Stress Evolution of Electroplated Cu Films during Self-annealing | Konferenzbeitrag Inproceedings | 2010 |