Proceedings of the 23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
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Proceedings of the 23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Orio, Roberto ; Ceric, Hajdin ; Selberherr, Siegfried | Electromigration Failure in a Copper Dual-Damascene Structure with a Through Silicon Via | Konferenzbeitrag Inproceedings | 2012 |