International Electron Devices Meeting (IEDM)
Book title Buchtitel
International Electron Devices Meeting (IEDM)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Lagger, Peter Willibald ; Ostermaier, C ; Pobegen, G. ; Pogany, Dionyz | Toward understanding the origin of threshold voltage instability of AlGaN/GaN MIS-HEMTs | Konferenzbeitrag Inproceedings | 2012 |