2012 International Electron Devices Meeting
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2012 International Electron Devices Meeting
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Bina, M. ; Rupp, K. ; Tyaginov, S. ; Triebl, O. ; Grasser, T. | Modeling of hot carrier degradation using a spherical harmonics expansion of the bipolar Boltzmann transport equation | Konferenzbeitrag Inproceedings | 2012 | |
| 2 | Grasser, T. ; Reisinger, H. ; Rott, K. ; Toledano-Luque, M. ; Kaczer, B. | On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs | Konferenzbeitrag Inproceedings | 2012 |