2013 IEEE International Reliability Physics Symposium (IRPS)

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2013 IEEE International Reliability Physics Symposium (IRPS)
 

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PreviewAuthor(s)TitleTypeIssue Date
1Singulani, A. P. ; Ceric, H. ; Langer, E. ; Carniello, S. Effects of Bosch scallops on metal layer stress of an open Through Silicon Via technologyKonferenzbeitrag Inproceedings2013