2013 IEEE International Electron Devices Meeting
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2013 IEEE International Electron Devices Meeting
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Stanojevic, Zlatan ; Karner, Markus ; Kosina, Hans | Exploring the design space of non-planar channels: Shape, orientation, and strain | Konferenzbeitrag Inproceedings | 2013 | |
| 2 | Grasser, T. ; Rott, K. ; Reisinger, H. ; Waltl, M. ; Wagner, P. ; Schanovsky, F. ; Goes, W. ; Pobegen, G. ; Kaczer, B. | Hydrogen-related volatile defects as the possible cause for the recoverable component of NBTI | Konferenzbeitrag Inproceedings | 2013 | |
| 3 | Franco, J. ; Kaczer, B. ; Roussel, Ph. J. ; Mitard, J. ; Sioncke, S. ; Witters, L. ; Mertens, H. ; Grasser, T. ; Groeseneken, G. | Understanding the suppressed charge trapping in relaxed- and strained-Ge/SiO<inf>2</inf>/HfO<inf>2</inf> pMOSFETs and implications for the screening of alternative high-mobility substrate/dielectric CMOS gate stacks | Konferenzbeitrag Inproceedings | 2013 |