2014 IEEE International Conference on IC Design & Technology

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		Preview	Author(s)	Title	Type	Issue Date
	1		Grasser, T. ; Rzepa, G. ; Waltl, M. ; Goes, W. ; Rott, K. ; Rott, G. ; Reisinger, H. ; Franco, J. ; Kaczer, B.	Characterization and modeling of charge trapping: From single defects to devices	Konferenzbeitrag Inproceedings	2014

2014 IEEE International Conference on IC Design &amp; Technology