2014 IEEE International Conference on IC Design & Technology
Book title Buchtitel
2014 IEEE International Conference on IC Design & Technology
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Grasser, T. ; Rzepa, G. ; Waltl, M. ; Goes, W. ; Rott, K. ; Rott, G. ; Reisinger, H. ; Franco, J. ; Kaczer, B. | Characterization and modeling of charge trapping: From single defects to devices | Konferenzbeitrag Inproceedings  | 2014 |