Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits
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Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Grasser, Tibor ; Rott, K. ; Reisinger, H. ; Waltl, Michael ; Gös, Wolfgang | Evidence for Defect Pairs in SiON pMOSFETs | Konferenzbeitrag Inproceedings | 2014 | |
| 2 | Bury, E. ; Degraeve, R. ; Cho, M. ; Kaczer, Ben ; Gös, Wolfgang ; Grasser, Tibor ; Horiguchi, N. ; Groeseneken, G. | Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG Devices | Konferenzbeitrag Inproceedings | 2014 |