Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics
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Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics
Results 1-4 of 4 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, Hajdin ; Zisser, Wolfhard ; Selberherr, Siegfried | Quantum Mechanical Calculations of Electromigration Characteristics | Konferenzbeitrag Inproceedings | 2014 | |
| 2 | Filipovic, Lado ; Selberherr, Siegfried | Stress Considerations for System-on-Chip Gas Sensor Integration in CMOS Technology | Konferenzbeitrag Inproceedings | 2014 | |
| 3 | Papaleo, Santo ; Zisser, Wolfhard ; Singulani, Anderson P. ; Ceric, Hajdin ; Selberherr, Siegfried | Stress Evolution During the Nanoindentation in Open TSVs | Konferenzbeitrag Inproceedings | 2014 | |
| 4 | Zisser, Wolfhard ; Ceric, Hajdin ; Selberherr, Siegfried | Void Evolution in Open TSVs | Konferenzbeitrag Inproceedings | 2014 |