Proceeding of the IEEE International Reliability Physics Symposium (IRPS)
Book title Buchtitel
Proceeding of the IEEE International Reliability Physics Symposium (IRPS)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Lagger, Peter Willibald ; Ostermaier, C ; Pogany, Dionyz | Enhancement of Vth Drift for Repetitive Gate Stress Pulses due to Charge Feedback Effect in GaN MIS-HEMTs | Konferenzbeitrag Inproceedings | 2014 |