Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)

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Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)
 

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PreviewAuthor(s)TitleTypeIssue Date
1Makarov, Alexander ; Windbacher, Thomas ; Sverdlov, Viktor ; Selberherr, Siegfried Concept of a SOT-MRAM based on 1Transistor-1MTJ-Cell StructureKonferenzbeitrag Inproceedings 2015
2Tyaginov, S. E. ; Chasin, A ; Makarov, Alexander ; El-Sayed, Al-Moatasem ; Jech, Markus ; De Keersgieter, An ; Eneman, G. ; Vandemaele, Michiel ; Franco, J. ; Linten, D ; Kaczer, Ben Physics-based Modeling of Hot-Carrier Degradation in Ge NWFETsKonferenzbeitrag Inproceedings 2019
3Makarov, Alexander ; Kaczer, Ben ; Roussel, Philippe ; Chasin, A ; Vandemaele, Michiel ; Hellings, Geert ; El-Sayed, Al-Moatasem ; Jech, Markus ; Grasser, Tibor ; Linten, D ; Tyaginov, S. E. Simulation Study: the Effect of Random Dopants and Random Traps on Hot-Carrier Degradation in nFinFETsKonferenzbeitrag Inproceedings 2019