2016 Symposium on VLSI Technology Digest of Technical Papers
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2016 Symposium on VLSI Technology Digest of Technical Papers
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Rzepa, Gerhard ; Waltl, Michael ; Gös, Wolfgang ; Kaczer, Ben ; Franco, J. ; Chiarella, T. ; Horiguchi, N. ; Grasser, Tibor | Complete Extraction of Defect Bands Responsible for Instabilities in n and pFinFETs | Konferenzbeitrag Inproceedings | 2016 |