2016 IEEE International Integrated Reliability Workshop (IIRW)
Book title Buchtitel
2016 IEEE International Integrated Reliability Workshop (IIRW)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Tyaginov, S.E. ; Makarov, A. ; Jech, M. ; Franco, J. ; Sharma, P. ; Kaczer, B. ; Grasser, T. | On the effect of interface traps on the carrier distribution function during hot-carrier degradation | Konferenzbeitrag Inproceedings  | 2016 |