2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

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Book title Buchtitel
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
 
Publisher Verlag
IEEE
 

Publications Publikationen

Results 1-5 of 5 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Kosina, Hans ; Kampl, Markus Effect of Electron-Electron Scattering on the Carrier Distribution in Semiconductor DevicesKonferenzbeitrag Inproceedings2018
2Makarov, Alexander ; Sverdlov, Viktor ; Selberherr, Siegfried Field-free Fast Reliable Deterministic Switching in Perpendicular Spin-Orbit Torque MRAM CellsKonferenzbeitrag Inproceedings2018
3Medina-Bailón, C. ; Sadi, T. ; Nedjalkov, Mihail ; Lee, J. ; Berrada, S. ; Carillo-Nunez, H. ; Georgiev, Vihar ; Selberherr, Siegfried ; Asenov, A Impact of the Effective Mass on the Mobility in Si Nanowire TransistorsKonferenzbeitrag Inproceedings2018
4Filipovic, Lado ; de Orio, Roberto Lacerda Modeling the Influence of Grains and Material Interfaces on ElectromigrationKonferenzbeitrag Inproceedings2018
5Toifl, Alexander ; Simonka, Vito ; Hössinger, Andreas ; Selberherr, Siegfried ; Weinbub, Josef Steady-State Empirical Model for Electrical Activation of Silicon-Implanted Gallium NitrideKonferenzbeitrag Inproceedings2018