Abstracts of the International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP)
Book title Buchtitel
Abstracts of the International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP)
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, Hajdin ; Selberherr, Siegfried ; Zahedmanesh, Houman ; Orio, Roberto ; Croes, Kristof | Assessment of Electromigration in Nano‐Interconnects | Konferenzbeitrag Inproceedings | 2019 |