2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
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2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Illarionov, Yu. Yu. ; Grasser, T. | Reliability of 2D Field-Effect Transistors: from First Prototypes to Scalable Devices | Konferenzbeitrag Inproceedings | 2019 |