2021 IEEE International Reliability Physics Symposium (IRPS)
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2021 IEEE International Reliability Physics Symposium (IRPS)
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Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Grasser, T. ; O'Sullivan, B. ; Kaczer, B. ; Franco, J. ; Stampfer, B. ; Waltl, M. | CV Stretch-Out Correction after Bias Temperature Stress: Work-Function Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast States | Konferenzbeitrag Inproceedings ![]() | 2021 |