Proceedings of the IEEE International Electron Devices Meeting (IEDM)

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2021-December

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		Preview	Authors / Editors	Title	Type	Issue Date
	1		Michl, J. ; Grill, Alexander ; Stampfer, B. ; Waldhoer, D. ; Schleich, Christian ; Knobloch, T. ; Ioannidis, E. ; Enichlmair, H. ; Minixhofer, R. ; Kaczer, B. ; Parvais, B. ; Govoreanu, Bogdan ; Radu, I. ; Grasser, T. ; Waltl, M.	Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS	Inproceedings Konferenzbeitrag	2021