Proceedings 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)

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Book title Buchtitel
Proceedings 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
 
ISBN
9781665499965
 
Publisher Herausgeber
IEEE
 
Volume Band
2022-September
 

Publications Publikationen

Results 1-8 of 8 (Search time: 0.003 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Tonejca, Lea ; Mauthner, Gernot ; Trautner, Thomas ; Koenig, Valentina ; Liemberger, Werner AI-Based Surface Roughness Prediction Model for Automated CAM-Planning OptimizationInproceedings Konferenzbeitrag5-Jan-2023
2Bhosale, Pushparaj ; Kastner, Wolfgang ; Sauter, Thilo Automating Safety and Security Risk Assessment in Industrial Control Systems: Challenges and ConstraintsInproceedings Konferenzbeitrag 2022
3Froschauer, Roman ; Köcher, Aljosha ; Meixner, Kristof ; Schmitt, Siwara ; Spitzer, Fabian Capabilities and Skills in Manufacturing: A Survey Over the Last Decade of ETFAInproceedings Konferenzbeitrag 2022
4Knorr, Felix ; Fruhwirth, Thomas ; Kastner, Wolfgang Functional Smart Grid Application DevelopmentInproceedings Konferenzbeitrag 1-Jan-2022
5Feichtinger, Kevin ; Meixner, Kristof ; Rinker, Felix ; Koren, István ; Eichelberger, Holger ; Heinemann, Tonja ; Holtmann, Jörg ; Konersmann, Marco ; Michael, Judith ; Neumann, Eva ; Pfeiffer, Jerome ; Rabiser, Rick ; Riebisch, Matthias ; Schmid, Klaus Industry Voices on Software Engineering Challenges in Cyber-Physical Production Systems EngineeringInproceedings Konferenzbeitrag 2022
6Gent, Sascha ; Gent Orskar ; Schörghofer, Paul ; Ramsauer, Christoph Marcus ; Bleicher, Friedrich ; Leder Norbert ; Fernández Gutiérrez, Ricardo ; Reiterer, Florian Maintenance interval monitoring and cutting edge breakout detection using an instrumented toolInproceedings Konferenzbeitrag 14-Nov-2022
7Hoffmann, David ; Biffl, Stefan ; Meixner, Kristof ; Lüder, Arndt Towards Design Patterns for Production SecurityInproceedings Konferenzbeitrag 2022
8Winkler, Dietmar ; Sherstneva, Serafima ; Biffl, Stefan Towards Multi-View Test Specification in CPPS EngineeringInproceedings Konferenzbeitrag 2022