2022 IEEE International Reliability Physics Symposium (IRPS)

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Book details Buch-Details

Book title Buchtitel
2022 IEEE International Reliability Physics Symposium (IRPS)
 
ISBN
9781665479509
 
Volume Band
2022-March
 

Publications Publikationen

Results 1-3 of 3 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Bogner, Christian ; Grasser, Tibor ; Waltl, Michael ; Reisinger, Hans ; Schlunder, Christian Efficient Evaluation of the Time-Dependent Threshold Voltage Distribution Due to NBTI Stress Using Transistor ArraysInproceedings Konferenzbeitrag 2022
2Knobloch, Theresia ; Illarionov, Yury Yu. ; Grasser, Tibor Finding Suitable Gate Insulators for Reliable 2D FETsKonferenzbeitrag Inproceedings2022
3Grill, A. ; John, V. ; Michl, J. ; Beckers, A. ; Bury, E. ; Tyaginov, S. ; Parvais, B. ; Chasin, A. Vaisman ; Grasser, Tibor ; Waltl, Michael ; Kaczer, B ; Govoreanu, B. Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k TransistorsInproceedings Konferenzbeitrag 2022