2021 IEEE European Test Symposium (ETS)

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2021 IEEE European Test Symposium (ETS)
 

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PreviewAuthor(s)TitleTypeIssue Date
1Naz, Syed Farah ; Shah, Ambika ; Ahmed, Suhaib ; Patrick, Girard ; Waltl, Michael Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular AutomataKonferenzbeitrag Inproceedings 2021
2Bosio, Alberto ; O´Connor, Ian ; Traiola, Marcello ; Echavarria, Jorge ; Teich, Juergen ; Hanif, Muhammad Abdullah ; Shafique, Muhammad ; Hamdioui, Said ; Deveautour, Bastien ; Girard, Patrick ; Bertels, Koen Emerging Computing Devices: Challenges and Opportunities for Test and ReliabilityKonferenzbeitrag Inproceedings2021