IEEE European Test Symposium (ETS) 2021

Event name

Event type

Event for scientific audience

Start date

24-05-2021

End date

28-05-2021

Country

Event format Veranstaltungsformat

Online

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		Preview	Author(s)	Title	Type	Issue Date
	1		Naz, Syed Farah ; Shah, Ambika ; Ahmed, Suhaib ; Patrick, Girard ; Waltl, Michael	Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata	Konferenzbeitrag Inproceedings	2021