20th Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST)

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Description

Event name
20th Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST)
 
Event type
Event for scientific audience
 
Start date
08-09-2024
End date
13-09-2024
 
Location
Bad Schandau
Country
Germany
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-1 of 1 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Behrle, Raphael ; Murphey, Corban G. E. ; Cahoon, James F. ; Barth, Sven Christian ; Den Hertog, Martien I. ; Weber, Walter Michael ; Sistani, Masiar Comparative Study of Charge Carrier Transport in Al-Si and Al-Ge Nanowire Heterostructure TransistorsInproceedings Konferenzbeitrag9-Sep-2024