35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, (ESREF 2024)

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Description

Event name
35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, (ESREF 2024)
 
Event type
Event for scientific audience
 
Start date
23-09-2024
End date
26-09-2024
 
Location
Parma
Country
Italy
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-2 of 2 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wieland, Dominik ; Butej, Boris ; Stabentheiner, Manuel ; Koller, Christian ; Pogany, Dionyz ; Ostermaier, Clemens Analyzing the role of hole injection on the short circuit performance of p-GaN gate power HEMTsInproceedings Konferenzbeitrag 25-Sep-2024
2Hofer, Anton Marco ; Koller, Christian ; Modolo, Nicola ; Pogany, Dionyz ; Ostermaier, Clemens Improved CV characterization technique for interface state evaluation in Si3N4/n-GaN MIS CapacitorsInproceedings Konferenzbeitrag 25-Sep-2024