2024 IEEE International Reliability Physics Symposium (IRPS)

Event name

Event type

Event for scientific audience

Start date

14-04-2024

End date

18-04-2024

Country

United States

Conference Track

Multi Track

Event format Veranstaltungsformat

On Site

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RIS EndNote Bibtex

		Preview	Author(s)	Title	Type	Issue Date
	1		Grasser, Tibor ; Feil, Maximilian ; Waschneck, Katja ; Reisinger, Hans ; Berens, Judith ; Waldhör, Dominic ; Vasilev, Alexander ; Waltl, Michael ; Aichinger, Thomas ; Bockstedte, Michel ; Gustin, Wolfgang ; Pobegen, Gregor	A Recombination-Enhanced-Defect-Reaction-Based Model for the Gate Switching Instability in SiC MOSFETs	Inproceedings Konferenzbeitrag	2024