13th International Workshop on Stress-Induced Phenomena in Microelectronics

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Description

Event name
13th International Workshop on Stress-Induced Phenomena in Microelectronics
 
Event type
Event for scientific audience
 
Start date
15-10-2014
End date
17-10-2014
 
Location
Austin, TX
Country
United States
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-4 of 4 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ceric, Hajdin ; Zisser, Wolfhard ; Selberherr, Siegfried Quantum Mechanical Calculations of Electromigration CharacteristicsKonferenzbeitrag Inproceedings2014
2Filipovic, Lado ; Selberherr, Siegfried Stress Considerations for System-on-Chip Gas Sensor Integration in CMOS TechnologyKonferenzbeitrag Inproceedings2014
3Papaleo, Santo ; Zisser, Wolfhard ; Singulani, Anderson P. ; Ceric, Hajdin ; Selberherr, Siegfried Stress Evolution During the Nanoindentation in Open TSVsKonferenzbeitrag Inproceedings2014
4Zisser, Wolfhard ; Ceric, Hajdin ; Selberherr, Siegfried Void Evolution in Open TSVsKonferenzbeitrag Inproceedings2014