12th International Workshop on Stress-Induced Phenomena in Microelectronics

Event name
12th International Workshop on Stress-Induced Phenomena in Microelectronics
 
Event type
Event for scientific audience
 
Start date
28-05-2012
End date
30-05-2012
 
Location
Kyoto
Country
Japan
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Ceric, Hajdin ; Orio, Roberto ; Zisser, Wolfhard ; Schnitzer, V. ; Selberherr, Siegfried Modeling of Microstructural Effects on Electromigration FailureKonferenzbeitrag Inproceedings2012