Denver X-Ray Conference

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Description

Event name
Denver X-Ray Conference
 
Event type
Event for scientific audience
 
Start date
04-08-2008
End date
08-08-2008
 
Location
Denver Colorado
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Pahlke, S.

Results 1-6 of 6 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Pepponi, Giancarlo ; Streli, Christina ; Beckhoff, B. ; Ulm, G. ; Ehmann, T. ; Pahlke, S. ; Fabry, L. NEXAFS Spectroscopy of Organic Contamination on Si Wafers by TXRFPräsentation Presentation2002
2Wobrauschek, Peter ; Osmic, F. ; Streli, Christina ; Pahlke, S. ; Fabry, L. Si drift detector versus Si(Li) detector for TXRF applicationsPräsentation Presentation2002
3Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3Präsentation Presentation2002
4Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator PGB Beamline at BESSYIIPräsentation Presentation2002
5Prost, Josef ; Felling, C. ; Wobrauschek, Peter ; Markowicz, A. ; Pahlke, S. ; Streli, Christina Technical improvements of a low power TXRF spectrometer and its application for aerosol analysisPräsentation Presentation2012
6Prost, Josef ; Felling, C. ; Wobrauschek, Peter ; Markowicz, A. ; Pahlke, S. ; Streli, Christina TXRF for aerosol analysisPräsentation Presentation2012