IEEE International Electron Devices Meeting (IEDM)

Event name
IEEE International Electron Devices Meeting (IEDM)
 
Event type
Event for scientific audience
 
Start date
11-12-1988
End date
14-12-1988
 
Location
San Francisco, CA, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Enichlmair, H.

Results 1-2 of 2 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Michl, J. ; Grill, Alexander ; Stampfer, B. ; Waldhoer, D. ; Schleich, Christian ; Knobloch, T. ; Ioannidis, E. ; Enichlmair, H. ; Minixhofer, R. ; Kaczer, B. ; Parvais, B. ; Govoreanu, Bogdan ; Radu, I. ; Grasser, T. ; Waltl, M. Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOSInproceedings Konferenzbeitrag2021
2Meinhardt, Gerald ; Kraft, J. ; Löffler, B. ; Enichlmair, H. ; Röhrer, G. ; Wachmann, E. ; Schrems, Martin ; Swoboda, R. ; Seidl, Christoph ; Zimmermann, Horst High-speed blue-, red-, and infrared-sensitive photodiode integrated in a 0.35 µm SiGe:C-BiCMOS processKonferenzbeitrag Inproceedings2005