International Workshop on Stress-Induced Phenomena in Metallization
Event name
International Workshop on Stress-Induced Phenomena in Metallization
Start date
12-09-2005
End date
14-09-2005
Location
Dresden
Country
Event format Veranstaltungsformat
On Site
Results 1-3 of 3 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, Hajdin ; Hollauer, Christian ; Selberherr, Siegfried | Microstructure and Stress Aspects of Electromigration Modeling | Konferenzbeitrag Inproceedings | 2005 | |
| 2 | Ceric, Hajdin ; Langer, Erasmus ; Selberherr, Siegfried | Modeling of Residual Stresses in Thin Metal Films | Konferenzbeitrag Inproceedings | 2007 | |
| 3 | Ceric, Hajdin ; Orio, Roberto ; Cervenka, Johann ; Selberherr, Siegfried | Stress-Induced Anisotropy of Electromigration in Copper Interconnects | Konferenzbeitrag Inproceedings | 2008 |