IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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Description

Event name
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
 
Event type
Event for scientific audience
 
Start date
27-06-2005
End date
01-07-2005
 
Location
Singapore
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Karner, Markus
Date Issued:  [2005 TO 2009]

Results 1-2 of 2 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Gös, Wolfgang ; Karner, Markus ; Sverdlov, Viktor ; Grasser, Tibor A Rigorous Model for Trapping and Detrapping in Thin Gate DielectricsKonferenzbeitrag Inproceedings2008
2Holzer, Stefan ; Hollauer, Christian ; Ceric, Hajdin ; Karner, Markus ; Grasser, Tibor ; Langer, Erasmus ; Selberherr, Siegfried Three-Dimensional Transient Interconnect Analysis With Regard to Mechanical StressKonferenzbeitrag Inproceedings2006