Silicon Nanoelectronics Workshop

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Description

Event name
Silicon Nanoelectronics Workshop
 
Event type
Event for scientific audience
 
Start date
11-06-2006
End date
12-06-2006
 
Location
Honolulu
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Treffer 1-7 von 7 (Suchzeit: 0.002 Sekunden).

VorschauAutor_in(nen)TitelDokumenttypErscheinungs­datum
1Illarionov, Yury ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Müller, Thomas ; Lemme, M.C. ; Grasser, Tibor Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: A Reliability ChallengeKonferenzbeitrag Inproceedings 2014
2Sverdlov, Viktor ; Ungersböck, Stephan Enzo ; Kosina, Hans ; Selberherr, Siegfried Comparative Study of Low-Field Mobilities in Double- and Single-Gate Ultra-Thin Body SOI for Different Substrate OrientationsKonferenzbeitrag Inproceedings 2006
3Karner, Markus ; Gehring, Andreas ; Holzer, Stefan ; Wagner, Martin ; Kosina, Hans Continuum Versus Quasi-Bound State Tunneling in Novel Device ArchitecturesKonferenzbeitrag Inproceedings 2006
4Dhar, Siddhartha ; Ungersböck, Stephan Enzo ; Kosina, Hans ; Grasser, Tibor ; Selberherr, Siegfried Electron Mobility Model for #lt110#gt Stressed Si Including Strain-Dependent MassKonferenzbeitrag Inproceedings 2006
5Stanojevic, Zlatan ; Baumgartner, Oskar ; Karner, Markus ; Filipovic, Lidija ; Kernstock, Christian ; Kosina, Hans Full-Band Modeling of Mobility in p-Type FinFETsKonferenzbeitrag Inproceedings 2014
6Entner, Robert ; Grasser, Tibor ; Enichlmair, H. ; Minixhofer, R. Influence of Interface and Oxide Traps on Negative Bias Temperature InstabilityKonferenzbeitrag Inproceedings 2006
7Stanojevic, Zlatan ; Kosina, Hans Modeling Surface-Roughness-Induced Scattering in Non-Planar Silicon NanostructuresKonferenzbeitrag Inproceedings 2013