International Reliability Physics Symposium (IRPS)

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Description

Event name
International Reliability Physics Symposium (IRPS)
 
Event type
Event for scientific audience
 
Start date
15-04-2007
End date
19-04-2007
 
Location
Phoenix
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Toledano-Luque, M.

Results 1-10 of 10 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Grasser, Tibor ; Rott, K. ; Reisinger, H. ; Wagner, Paul-Jürgen ; Gös, Wolfgang ; Schanovsky, Franz ; Waltl, Michael ; Toledano-Luque, M. ; Kaczer, Ben Advanced Characterization of Oxide Traps: The Dynamic Time-Dependent Defect SpectroscopyKonferenzbeitrag Inproceedings2013
2Kaczer, Ben ; Mahato, S. ; Valduga de Almeida Camargo, V. ; Toledano-Luque, M. ; Roussel, Ph. J. ; Grasser, Tibor ; Catthoor, F. ; Dobrovolny, P. ; Zuber, P. ; Wirth, G.I. ; Groeseneken, G. Atomistic Approach to Variability of Bias-Temperature Instability in Circuit SimulationsKonferenzbeitrag Inproceedings2011
3Toledano-Luque, M. ; Kaczer, Ben ; Simoen, E. ; Degraeve, R. ; Franco, J. ; Roussel, Ph. J. ; Grasser, Tibor ; Groeseneken, G. Correlation of Single Trapping and Detrapping Effects in Drain and Gate Currents of Nanoscaled nFETs and pFETsKonferenzbeitrag Inproceedings2012
4Weckx, P. ; Kaczer, Ben ; Toledano-Luque, M. ; Grasser, Tibor ; Roussel, Ph. J. ; Kukner, H. ; Raghavan, P. ; Catthoor, F. ; Groeseneken, G. Defect-based Methodology for Workload-dependent Circuit Lifetime Projections - Application to SRAMKonferenzbeitrag Inproceedings2013
5Franco, J. ; Kaczer, Ben ; Toledano-Luque, M. ; Roussel, Ph. J. ; Mitard, J. ; Ragnarsson, L. A. ; Witters, L. ; Chiarella, T. ; Togo, M. ; Horiguchi, N. ; Groeseneken, G. ; Bukhori, Muhammad Faiz ; Grasser, Tibor ; Asenov, A Impact of Single Charged Gate Oxide Defects on the Performance and Scaling of Nanoscaled FETsKonferenzbeitrag Inproceedings2012
6Kaczer, Ben ; Chen, C. ; Weckx, P. ; Roussel, Ph. J. ; Toledano-Luque, M. ; Cho, M. ; Watt, J. T. ; Chanda, K. ; Groeseneken, G. ; Grasser, Tibor Maximizing reliable performance of advanced CMOS circuits-A case studyKonferenzbeitrag Inproceedings2014
7Grasser, Tibor ; Kaczer, Ben ; Reisinger, H. ; Wagner, Paul-Jürgen ; Toledano-Luque, M. On the Frequency Dependence of the Bias Temperature InstabilityKonferenzbeitrag Inproceedings2012
8Franco, J. ; Kaczer, Ben ; Toledano-Luque, M. ; Roussel, Ph. J. ; Groeseneken, G. ; Schwarz, Benedikt ; Bina, Markus ; Waltl, Michael ; Wagner, Paul-Jürgen ; Grasser, Tibor Reduction of the BTI Time-Dependent Variability in Nanoscaled MOSFETs by Body BiasKonferenzbeitrag Inproceedings2013
9Toledano-Luque, M. ; Kaczer, Ben ; Roussel, Ph. J. ; Grasser, Tibor ; Wirth, G.I. ; Franco, J. ; Vrancken, C. ; Horiguchi, N. ; Groeseneken, G. Response of a Single Trap to AC Negative Bias Temperature StressKonferenzbeitrag Inproceedings2011
10Kaczer, Ben ; Franco, J. ; Toledano-Luque, M. ; Roussel, Ph. J. ; Bukhori, Muhammad Faiz ; Asenov, A ; Schwarz, Benedikt ; Bina, Markus ; Grasser, Tibor ; Groeseneken, G. The Relevance of Deeply-Scaled FET Threshold Voltage Shifts for Operation LifetimesKonferenzbeitrag Inproceedings2012