|
| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Pogany, Dionyz ; Gornik, Erich ; Willemen, Joost ; Qu, N ; Wilkening, W ; Zullino, L. ; Andreini, A. | A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress | Präsentation Presentation | 2003 |
| 2 | | Heer, Michael ; Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Frank, M ; Konrad, A ; Schulz, J | Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up | Präsentation Presentation | 2006 |
| 3 | | Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Gornik, Erich | Application of transient interferometric mapping method for ESD and latch-up analysis | Präsentation Presentation | 2011 |
| 4 | | Heer, Michael ; Dubec, Victor ; Blaho, M. ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Stecher, Matthias ; Groos, Gerhard | Automated setup for thermal imaging and electrical degradation study of power DMOS devices | Präsentation Presentation | 2005 |
| 5 | | Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Brodbeck, T ; Stadler, Wolfgang | Backside Interferometric Methods for Localization of ESD-Induced Leakage Current and Metal Shorts | Präsentation Presentation | 2007 |
| 6 | | Pogany, Dionyz ; Esmark, Kai ; Litzenberger, Martin ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich | Bulk and surface degradation mode in 0.35um technology gg-nMOS ESD protection devices | Präsentation Presentation | 2000 |
| 7 | | Stadler, Wolfgang ; Esmark, Kai ; Gossner, Harald ; Streibl, M. ; Wendel, M. ; Fichtner, W. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich | Device Simulation and Backside Laser Interferometry - Powerful Tools for ESD Protection Development | Präsentation Presentation | 2002 |
| 8 | | Litzenberger, Martin ; Pichler, R. ; Bychikhin, Sergey ; Pogany, Dionyz ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich | Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection structures | Präsentation Presentation | 2001 |
| 9 | | Pogany, Dionyz ; Kuzmik, Jan ; Darmo, Juraj ; Litzenberger, Martin ; Bychikhin, Sergey ; Unterrainer, Karl ; Gornik, Erich ; Mozolova, Z. ; Hascik, S. ; Lalinsky, T. | Electrical fied mapping in InGaPHEMTs and GaAs teraherz emitters using backside infrared OBIC technique | Präsentation Presentation | 2002 |
| 10 | | Blaho, M. ; Pogany, Dionyz ; Gornik, Erich ; Zullino, L. ; Andreini, A. | Expermental ans simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions | Präsentation Presentation | 2002 |
| 11 | | Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Heer, Michael ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Stecher, Matthias ; Groos, Gerhard | Multiple-time-instant 2D thermal mapping during a single ESD event | Präsentation Presentation | 2004 |
| 12 | | Podgaynaya, Alevtina ; Rudolf, R ; Elattari, B ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias | Single pulse energy capability and failure modes of n- and p- channel LDMOS with thick copper metallization | Präsentation Presentation | 2010 |
| 13 | | Litzenberger, Martin ; Esmark, Kai ; Pogany, Dionyz ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich ; Fichtner, W. | Study of tiggering inhomogeneities in gg-nMOS ESD protection devices via thermal mapping using bachside laser interferometry | Präsentation Presentation | 2000 |
| 14 | | Fürböck, Christoph ; Esmark, Kai ; Litzenberger, Martin ; Pogany, Dionyz ; Groos, Gerhard ; Zelsacher, R. ; Stecher, Matthias ; Gornik, Erich | Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using a modified laser interferometry technique | Präsentation Presentation | 2000 |
| 15 | | Bychikhin, Sergey ; Litzenberger, Martin ; Pichler, R. ; Pogany, Dionyz ; Gornik, Erich ; Groos, Gerhard ; Stecher, Matthias | Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures | Präsentation Presentation | 2001 |
| 16 | | Haberfehlner, Georg ; Bychikhin, Sergey ; Dubec, Victor ; Heer, Michael ; Podgaynaya, A ; Pfost, M ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz | Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system | Präsentation Presentation | 2009 |
| 17 | | Bychikhin, Sergey ; Dubec, Victor ; Pogany, Dionyz ; Gornik, Erich ; Graf, M. ; Dudek, V. ; Soppa, W. | Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress | Präsentation Presentation | 2004 |
