European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)

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Description

Event name
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
 
Event type
Event for scientific audience
 
Start date
23-09-2019
End date
26-09-2019
 
Location
Maastricht
Country
Netherlands
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Stecher, Matthias

Results 1-6 of 6 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Heer, Michael ; Dubec, Victor ; Blaho, M. ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Stecher, Matthias ; Groos, Gerhard Automated setup for thermal imaging and electrical degradation study of power DMOS devicesPräsentation Presentation2005
2Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Heer, Michael ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Stecher, Matthias ; Groos, Gerhard Multiple-time-instant 2D thermal mapping during a single ESD eventPräsentation Presentation2004
3Podgaynaya, Alevtina ; Rudolf, R ; Elattari, B ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Single pulse energy capability and failure modes of n- and p- channel LDMOS with thick copper metallizationPräsentation Presentation2010
4Fürböck, Christoph ; Esmark, Kai ; Litzenberger, Martin ; Pogany, Dionyz ; Groos, Gerhard ; Zelsacher, R. ; Stecher, Matthias ; Gornik, Erich Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using a modified laser interferometry techniquePräsentation Presentation2000
5Bychikhin, Sergey ; Litzenberger, Martin ; Pichler, R. ; Pogany, Dionyz ; Gornik, Erich ; Groos, Gerhard ; Stecher, Matthias Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structuresPräsentation Presentation2001
6Haberfehlner, Georg ; Bychikhin, Sergey ; Dubec, Victor ; Heer, Michael ; Podgaynaya, A ; Pfost, M ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping systemPräsentation Presentation2009