European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)

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Description

Event name
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
 
Event type
Event for scientific audience
 
Start date
23-09-2019
End date
26-09-2019
 
Location
Maastricht
Country
Netherlands
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Heer, Michael

Results 1-8 of 8 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Heer, Michael ; Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Frank, M ; Konrad, A ; Schulz, J Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-upPräsentation Presentation2006
2Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Gornik, Erich Application of transient interferometric mapping method for ESD and latch-up analysisPräsentation Presentation2011
3Heer, Michael ; Dubec, Victor ; Blaho, M. ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Stecher, Matthias ; Groos, Gerhard Automated setup for thermal imaging and electrical degradation study of power DMOS devicesPräsentation Presentation2005
4Rigato, Matteo ; Fleury, Clement ; Heer, Michael ; Simbürger, Werner ; Pogany, Dionyz ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping techniquePräsentation Presentation2015
5Heer, Michael ; Bychikhin, Sergey ; Mamanee, Wasinee ; Pogany, Dionyz ; Heid, A ; Grambach, P ; Klaussner, M ; Soppa, W. ; Ramler, B Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devicesPräsentation Presentation2007
6Heer, Michael ; Grombach, P ; Heid, A ; Pogany, Dionyz Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applicationsPräsentation Presentation2008
7Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Heer, Michael ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Stecher, Matthias ; Groos, Gerhard Multiple-time-instant 2D thermal mapping during a single ESD eventPräsentation Presentation2004
8Haberfehlner, Georg ; Bychikhin, Sergey ; Dubec, Victor ; Heer, Michael ; Podgaynaya, A ; Pfost, M ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping systemPräsentation Presentation2009