International Workshop on Stress-Induced Phenomena in Microelectronics
Event name
International Workshop on Stress-Induced Phenomena in Microelectronics
Start date
28-05-2012
End date
30-05-2012
Location
Kyoto, Japan
Country
Event format Veranstaltungsformat
On Site
Results 1-5 of 5 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, Hajdin ; Orio, Roberto ; Zisser, Wolfhard ; Schnitzer, V. ; Selberherr, Siegfried | Modeling of Microstructural Effects on Electromigration Failure | Konferenzbeitrag Inproceedings | 2012 | |
| 2 | Ceric, Hajdin ; Zisser, Wolfhard ; Selberherr, Siegfried | Quantum Mechanical Calculations of Electromigration Characteristics | Konferenzbeitrag Inproceedings | 2014 | |
| 3 | Filipovic, Lado ; Selberherr, Siegfried | Stress Considerations for System-on-Chip Gas Sensor Integration in CMOS Technology | Konferenzbeitrag Inproceedings | 2014 | |
| 4 | Papaleo, Santo ; Zisser, Wolfhard ; Singulani, Anderson P. ; Ceric, Hajdin ; Selberherr, Siegfried | Stress Evolution During the Nanoindentation in Open TSVs | Konferenzbeitrag Inproceedings | 2014 | |
| 5 | Zisser, Wolfhard ; Ceric, Hajdin ; Selberherr, Siegfried | Void Evolution in Open TSVs | Konferenzbeitrag Inproceedings | 2014 |