23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Event name
23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Start date
01-10-2012
End date
05-10-2012
Location
Cagliari, Italy
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.0 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Orio, Roberto ; Ceric, Hajdin ; Selberherr, Siegfried | Electromigration Failure in a Copper Dual-Damascene Structure with a Through Silicon Via | Konferenzbeitrag Inproceedings | 2012 |