IEEE International Conference on IC Design and Technology (ICICDT)

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Description

Event name
IEEE International Conference on IC Design and Technology (ICICDT)
 
Start date
30-05-2012
End date
01-06-2012
 
Location
Austin, TX, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-3 of 3 (Search time: 0.001 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Grasser, T. ; Rzepa, G. ; Waltl, M. ; Goes, W. ; Rott, K. ; Rott, G. ; Reisinger, H. ; Franco, J. ; Kaczer, B. Characterization and modeling of charge trapping: From single defects to devicesKonferenzbeitrag Inproceedings 2014
2Franco, J. ; Arimura, H. ; de Marneffe, J.-F. ; Vandooren, A. ; Ragnarsson, L.-A ; Wu, Z. ; Claes, D. ; Litta, E. Dentoni ; Horiguchi, N. ; Croes, K. ; Linten, D. ; Grasser, T. ; Kaczer, B. Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paperKonferenzbeitrag Inproceedings2021
3Franco, J. ; Kaczer, Ben ; Mitard, J. ; Toledano-Luque, M. ; Crupi, F. ; Eneman, G. ; Roussel, Ph. J. ; Grasser, Tibor ; Cho, M. ; Kauerauf, T. ; Witters, L. ; Hellings, Geert ; Ragnarsson, L. A. ; Horiguchi, N. ; Heyns, Marc M. ; Groeseneken, G. Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applicationsKonferenzbeitrag Inproceedings2012