International Symposium on VLSI Technology
Event name
International Symposium on VLSI Technology
Start date
11-06-2013
End date
14-06-2013
Location
Kyoto, Japan
Country
Event format Veranstaltungsformat
On Site
Results 1-3 of 3 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Rzepa, Gerhard ; Waltl, Michael ; Gös, Wolfgang ; Kaczer, Ben ; Franco, J. ; Chiarella, T. ; Horiguchi, N. ; Grasser, Tibor | Complete Extraction of Defect Bands Responsible for Instabilities in n and pFinFETs | Konferenzbeitrag Inproceedings | 2016 | |
| 2 | Toledano-Luque, M. ; Kaczer, Ben ; Franco, J. ; Roussel, Philippe J. ; Bina, Markus ; Grasser, Tibor ; Cho, M. ; Weckx, P. ; Groeseneken, Guido | Degradation of time dependent variability due to interface state generation | Konferenzbeitrag Inproceedings  | 2013 | |
| 3 | Franco, J. ; Marneffe, J.-F. ; Vandooren, Anne ; Arimura, H ; Ragnarsson, L. A. ; Claes, Dieter ; Litta, Eugenio Dentoni ; Horiguchi, N. ; Croes, Kristof ; Linten, D ; Grasser, Tibor ; Kaczer, Ben | Low Temperature Atomic Hydrogen Treatment for Superior NBTI Reliability -- Demonstration and Modeling across SiO2 IL Thicknesses from 1.8 to 0.6 nm for I/O and Core Logic | Konferenzbeitrag Inproceedings | 2021 |