International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP)
Event name
International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP)
Start date
04-11-2019
End date
06-11-2019
Location
San Jose, USA
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
Preview | Authors / Editors | Title | Type | Issue Date | |
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1 | Ceric, Hajdin ; Selberherr, Siegfried ; Zahedmanesh, Houman ; Orio, Roberto ; Croes, Kristof | Assessment of Electromigration in Nano‐Interconnects | Konferenzbeitrag Inproceedings | 2019 |