17th International Conference on Microscopy of Semiconducting Materials 2011

Event name
17th International Conference on Microscopy of Semiconducting Materials 2011
 
Start date
04-04-2011
End date
07-04-2011
 
Location
Churchill College, Cambridge, UK
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen



Results 1-1 of 1 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Stöger-Pollach, Michael ; Steiger-Thirsfeld, Andreas ; Schwarz, Sabine Low voltage TEM for semiconductor analysisKonferenzbeitrag Inproceedings2011