Microscopy & Microanalysis 2016 Meeting
Event name
Microscopy & Microanalysis 2016 Meeting
Event type
Event for scientific audience
Start date
24-07-2016
End date
28-07-2016
Location
Columbus, Ohio
Country
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Müller-Caspary, Knut ; Krause, Florian ; Béché, Armand ; Duchamp, Martial ; Schowalter, Marco ; Huth, Martin ; Löffler, Stefan ; Rosenauer, Andreas | Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors | Präsentation Presentation | 2016 | |
| 2 | Schneider, Sebastian ; Pohl, Darius ; Löffler, Stefan ; Kasinathan, Deepa ; Rusz, Jan ; Schattschneider, Peter ; Schultz, Ludwig ; Rellinghaus, Bernd | Quantifying Magnetism on the nm Scale: EMCD on Individual FePt Nanoparticles | Präsentation Presentation | 2016 |